##  [Single‑Event Upset (SEU)](/single-event-upset-seu) 

  ##  [Single‑Event Upset (SEU)](https://engineering.quantumdictionary.io/single-event-upset-seu-0) 

  

 [![Engineering & Applied Technologies Dictionary](/sites/default/files/styles/large/public/2026-01/Engineering%20%26%20Applied%20Technologies.png.webp?itok=_IKO7_-n)](/topic-specific-dictionaries/engineering-applied-technologies)



**Engineering & Applied Technologies Dictionary**

 







 

 

 

 



 

 

 

 

Definition

A transient, non‑destructive change of logic state in a digital memory cell or logic element caused by a single energetic particle (charged ion, proton, neutron or secondary ionization) depositing sufficient charge to exceed the node's critical charge; the physical device structure remains functional unless other damage occurs.